A Short Introduction to Tomographic Grain Map Reconstruction
نویسنده
چکیده
Recent X-ray techniques allow for the first time to image small crystals – known as grains – deep inside of polycrystalline materials. This is of interest in materials science. Two important techniques are based on tomography principles related to discrete tomography. We give a short introduction to the basic reconstruction problems arising in this context. The focus is on revealing the mathematical structure and the relationship to discrete tomography by abstracting from the experimental setup details. Concepts are explained for readers with no background in diffraction theory.
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